Cr K edge x-ray absorption study of Cr dopants in Mg2SiO4 and Ca2GeO4

Applied Physics Letters

Volumn 71, Issue 9, 1997, Pages 1168-1170

  Miyano, K E ^a   Woicik, J C ^b   Sujatha Devi, P ^c   Gafney, H D ^c  

^a CITY UNIVERSITY OF NEW YORK   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^c CITY UNIVERSITY OF NEW YORK   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000017501     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.119615     Document Type: Article

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