Scanning tunnelling microscopy of the interaction of hydrogen with silicon surfaces

Advances in Physics

Volumn 42, Issue 2, 1993, Pages 129-171

  Boland, John J ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000010085     PISSN: 00018732     EISSN: 14606976     Source Type: Journal    
DOI: 10.1080/00018739300101474     Document Type: Article

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