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Volumn 42, Issue 5, 1990, Pages 2735-2743

Conductance fluctuations and 1/f noise in Bi

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000003925     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevB.42.2735     Document Type: Article
Times cited : (51)

References (60)
  • 3
    • 84926868841 scopus 로고    scopus 로고
    • and references therein.
  • 5
    • 84926803003 scopus 로고    scopus 로고
    • and references therein.
  • 10
    • 84931498282 scopus 로고
    • (1985) ibid. , vol.42 , pp. 359
  • 21
    • 84926803002 scopus 로고    scopus 로고
    • See also Ref. 9.
  • 33
    • 84926824907 scopus 로고    scopus 로고
    • Suppl. 26-3;
  • 48
    • 84926868840 scopus 로고    scopus 로고
    • R. Kree, in Noise in Physical Systems, edited by C. M Van Vliet (World Scientific, Singapore, 1987). These authors have considered 1/f noise due to tunneling systems using a conventional or local coupling. The temperature dependence of ns(T) and the 1/f spectral shape they derive from the tunneling model are relevant here, but the magnitude of the noise they predict is much smaller than that predicted by the theory of FLS.
  • 49
    • 84926824906 scopus 로고    scopus 로고
    • Beutler et al.. (Ref. 19) estimate kF=2.5 nm-1 and le=0.8 nm for their sputtered Bi films. However, those films have much higher resistivity and smaller grain size than the thermally evaporated films studied by us and in Ref. 23.
  • 60
    • 84926868839 scopus 로고    scopus 로고
    • Magnetofingerprint data such as those shown in Fig. 7 often change over a period of several hours, due probably to large-scale atomic rearrangements. Such large changes may be induced by noise entering via the sample leads, as discussed by R. A. Webb, S. Washburn, H. J. Haucke, A. D. Benoit, C. P. Umbach, and F. P. Milliken, in Physics and Technology of Submicron Structures (Ref. 34), p. 98.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.