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Volumn 1, Issue 2, 1981, Pages 201-215
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DC plasma etching of silicon by sulfur hexafluoride. Mass spectrometric study of the discharge products
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Author keywords
mass spectroscopy; SF6 discharge; silicon
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Indexed keywords
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EID: 0000002852
PISSN: 02724324
EISSN: 15728986
Source Type: Journal
DOI: 10.1007/BF00564581 Document Type: Article |
Times cited : (36)
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References (19)
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