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Volumn 60, Issue 4, 1999, Pages R2150-R2153

Molecular-dynamics investigation of the surface stress distribution in a Ge/Si quantum dot superlattice

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000001761     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.60.R2150     Document Type: Article
Times cited : (49)

References (24)
  • 2
    • 0031071122 scopus 로고    scopus 로고
    • Other stacked quantum dot systems include Ge/Si
    • Other stacked quantum dot systems include Ge/Si, A. A. Darhuber, et al., Thin Solid Films, 294, 296 (1997);
    • (1997) Thin Solid Films , vol.294 , pp. 296
    • Darhuber, A.A.1
  • 3
    • 0001026921 scopus 로고    scopus 로고
    • GaN/AlN
    • GaN/AlN, F. Widmann, et al., J. Appl. Phys., 83, 7618 (1998)
    • (1998) J. Appl. Phys. , vol.83 , pp. 7618
    • Widmann, F.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.